On June 2, the Canadian Centre for Electron Microscopy (CCEM) welcomed 120 participants to a mini-conference on campus that focused on advanced electron microscopy methods in materials and chemistry research.
Held in conjunction with the 100th Canadian Chemistry Conference & Exhibition as a satellite event, the conference brought eight leading electron microscopy researchers from countries around the world including the U.S., France and Germany.
Researchers delivered workshops on topics such as imaging and analysis techniques of 2D materials, like graphene, energy storage materials and biomaterials, and trends in ion beam technology.
“This conference really demonstrates the wide-spread impact electron microscopy has on developments across fields in materials and chemistry and the world-class capabilities at McMaster and the CCEM,” said Kathryn Grandfield, assistant professor, Materials Science and Engineering at McMaster and director, user operations at CCEM. “It’s great to see so many people coming from all over the world to learn the latest advances in microscopy methods.”
“This meeting will generate new collaborations between researchers and will benefit the Canadian research enterprise and the public,” added Gianluigi Botton, professor, Materials Science and Engineering at McMaster and science director, CCEM.
